Dynamically & Accurately Test Capacitors, Inductors, & Power Semiconductors Including IGBTs & SCRs.
Pinpoints bad capacitors and inductors in-circuit
The only tester on the market that dynamically analyzes capacitors out of circuit for all four failures: 1. Value from 1pF to 20F 2. Equivalent series resistance (ESR) 3. Leakage up to 1000V 4. Dielectric absorption (DA)
Test IGBTs, Triacs, SCRs, Diodes, FETs, and Bipolar transistors at full voltage
Automatically applies the proper gate/base signal to turn-on three leaded power components
Leakage test up to 1000V to locate high voltage shorts missed by other testers.
Tests surface mount components in-circuit with the AP291 adjustable test probe.
Dynamically analyze inductors with exclusive patented tests for: 1. Value to 0.1uH to H 2. Opens and shorts 3. Shorted turns with the patented ringer test.
